Interference of electron waves has developed from a fascinating phenomenon in basic physics to a key method for the highly sophisticated investigation of both electric and magnetic structures in solid-state materials. After more than 20 years of development, electron holography in the transmission electron microscope is now a very powerful technique for the analysis of micro-fields down to atomic dimensions. The applications extend from highly sensitive measurements in semiconductor technology to the quantitative characterization of atomic structures.
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Hannes Lichte (2002) studied this question.
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