Spectral-reflectance reconstruction in the near-infrared region by use of conventional charge-coupled-device camera measurements

Our aim is to develop a method for obtaining the reflectance spectra of samples in the near-infrared (NIR) region (800-1,000 nm) by using a small number of measurements performed with a conventional CCD camera (multispectral imaging). We experimentally determined the spectral sensitivity of the CCD camera in the NIR range, used a method based on principal component analysis to reconstruct the spectral reflectance of the samples, and analyzed the number and shape of the filters that need tobe used to apply this method. Finally we obtained the reflectance spectra of a set of 30 spectral curves by numerical simulation. The small amount of errors in the spectral reconstruction shows the potential of this method for reconstructing spectral reflectances in the NIR range.