Estimation and Optimum Constant-Stress Partially Accelerated Life Test Plans for Gompertz Distribution with Type-I Censoring

Partially Accelerated life tests (PALT) are used when the data obtained from Accelerated life tests (ALT) cannot be extrapolated to normal conditions. This paper deals with the case of Constant-Stress Partially Accelerated life tests (CS-PALT) under type-I censoring. The lifetime distribution of the test item is assumed to follow Gompertz distribution. Maximum Likelihood method (MLE) is used to estimate the parameters of distribution and acceleration factor. In addition, approximate confidence intervals of the parameters are constructed. Furthermore, optimum plans for constant-stress PALT is obtained. Finally, for illustration, numerical examples are presented.