The application of axisymmetric lattice Boltzmann two-phase model on simulations of liquid film dewetting

An axisymmetric two-phase lattice Boltzmann method is applied to simulate the dewetting dynamics of a thin liquid film on a substrate. Initially, a circular dry spot exists in the center of the liquid film. A contact line forms around the dry spot and expands outwards. The liquid films dewetting on smooth and rough substrates are investigated. For a smooth substrate, the effects of the contact angle (θeq), Ohnesorge number (Oh), and viscosity ratio (λμ) are studied. It is observed that the contact line recedes with a constant velocity V and that if θeq > 45°, V has a linear relationship with θeq, which has never been mentioned in previous literatures. For a rough substrate, well-distributed pillars are set up to represent the roughness. There are two states for the liquid film dewetting on a rough substrate: Cassie and Wenzel states. By comparison, it is found that the speed of the liquid film dewetting on the rough substrate of the Cassie state is slightly faster than that on the smooth substrate but much faster than that on the rough substrate of the Wenzel state, i.e., Wenzel state can obviously hold back the movement of the receding contact line. The corresponding mechanism is analyzed. The effect of the geometric factors of the pillars on the dewetting speed is discussed in detail. It is indicated that both the width and the depth of the grooves in roughness can significantly affect the dewetting speed. The results are helpful to design structured substrates for controlling the dewetting process of the liquid film.