Calculation of secondary electron emission yield /spl gamma/ from MgO surface

Secondary electron emission yield /spl gamma/ values for rare-gas particles (He, Ne, Ar, Kr, and Xe ions of atoms and molecules, metastable atoms, and excimers) of MgO deposited under optimum conditions for the highest /spl gamma/ values were calculated assuming the Auger transitions between the valence band, and the F (oxygen ion vacancy + two electrons) and F/sup +/ (oxygen ion vacancy + one electron) centers in the MgO surface. These calculated /spl gamma/ values are probably the same as /spl gamma/ values for MgO used in practice. As for combination of the MgO with these rare-gas particles, all the calculated /spl gamma/ values fall to nonzero; resonance neutralization cannot occur for the rare-gas particles except Ne and Xe/sub 2/ ions. Therefore, /spl gamma/ values of the MgO for these rare-gas particles, other than Ne and Xe/sub 2/ ions, are determined only by Auger neutralization. For Ne and Xe/sub 2/ ions, the influence of resonance neutralization effect on calculated /spl gamma/ values of ions is small. Therefore, /spl gamma/ values of the MgO for Ne and Xe/sub 2/ ions are also almost determined only by Auger neutralization. The /spl gamma/ values for the ions of atoms are a little larger than those for the ions of molecules. The /spl gamma/ values of the metastable atoms are also a little larger than those of the excimers. As for MgO without defect states, calculated /spl gamma/ values of Ar, Kr, and Xe ions of atoms and molecules fall to zero; calculated /spl gamma/ value of Xe/sub 2/ excimer at the lowest continuous spectrum also falls to zero; these calculated /spl gamma/ values for MgO without defect states are probably the lowest values theoretically. As for rare-gas ions of atoms, the calculated /spl gamma/ values have been compared with experimental results reported previously. These results will be useful in detailed investigations into the mechanism of discharge of plasma display panels (PDPs).