Direct measurement for the decay probabilities of 4djhole states in xenon by means of photoelectron-ion coincidences

The decay probabilities of the 4d j hole states in xenon into the differently charged ion states, i.e. fluorescence decay, normal Auger together with discrete double Auger decay and continuous double Auger decay, are measured directly by means of coincidences between 4d j photoelectrons and xenon ions. Special emphasis is given to the strength of continuous double Auger transitions which is a direct manifestation of strong electron correlations during the non-radiative decay. In order to obtain reliable values, the problem for the correct extraction of true coincidences from the observed ones is also discussed in detail.