Yields of multicharged Xe ions in the M-shell transition region

Multiple photoionisation of Xe has been studied in the M-shell ionization region (650-1270 eV) using a time-of-flight mass spectrometer. The efficiency of multiple photoionization increases in the 3d electron transition region. Partial cross sections for Xe 4+ , Xe 5+ and Xe 6+ yields have an energy dependence similar to that of the photoabsorption cross section in this region. At the 3p threshold, the partial photoionization cross sections of Xe 7+ and Xe 8+ increase considerably. Double Auger transition is estimated to occur at least about 40% in de-excitation processes from M-shell hole states.