Stabilization of Low‐Temperature Degradation in Mixed Ionic and Electronic Conducting Perovskite Oxygen Permeation Membranes

An important degradation mechanism of perovskite membranes is related to the operation-induced surface segregation of trace impurities of sulfur that appears to dramatically impact the low-temperature permeation behavior. A simple but remarkably effective method is reported that enables the low-temperature stabilization of the permeation flux in these perovskite membranes (see picture).