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The structure of vacuum deposited thin films of tetracene was investigated for a range of deposition conditions (film thickness 34 to 500 nm, deposition rate 0.2 to 2.5 nm s−1, on substrates of glass, glass coated with aluminium or tin oxide, and collodion) by replica and direct transmission electron microscopy. The films were found to be polycrystalline with the crystal size decreasing slightly with deposition rate, but increasing with film thickness. In view of their physical properties, the detection of whiskers was of special significance.
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Riemer et al. (1972) studied this question.
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