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March 1, 1986IEEE Transactions on Instrumentation and Measurement

An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line method

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SCShuh-Han ChaoTaiwan Shoufu University

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Shuh-Han Chao (1986) studied this question.

synapsesocial.com/papers/6a7a6e522eb3c7e469f3fd23 https://doi.org/10.1109/tim.1986.6499053

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