Answers are grounded in this paper and cite their sources.
Ellipsometry is a technique which is suitable for the examination of thin films of materials and surface layers. The paper gives the theory and outline of the basic instrument and the modifications which have been employed to increase the sensitivity of the method. An indication is given of the application to thickness measurement and optical constants for absorbing and nonabsorbing media.
No takes yet. Share an insight, caveat, or question.
Neal et al. (1973) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: