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July 1, 2010Microscopy TodayOpen Access

Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology

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PSP. SchloßmacherThermo Fisher Scientific (Netherlands)DKD. O. KlenovUniversity of California, Santa Barbara BFBert FreitagThermo Fisher Scientific (Netherlands)

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Schloßmacher et al. (2010) studied this question.

synapsesocial.com/papers/6a7ad4f0e357fbdac589af29 https://doi.org/10.1017/s1551929510000404

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1An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes2009 · 60 citations