We have synthesized a series of zirconium nitride--aluminum nitride multilayers with a reactive sputtering technique. Structure and elastic response of these multilayers are characterized by x-ray-diffraction and transient piezoreflectance measurements. We observe a systematic decrease of the longitudinal elastic response in the direction of film growth as the composition modulation wavelength decreases. This contradicts a recent model of elastic response which predicts the absence of elastic anomaly in metal-insulator multilayers.
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Meng et al. (1990) studied this question.
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