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December 1, 1963Applied Physics Letters

MICROSCOPY OF INTERNAL CRYSTAL IMPERFECTIONS IN Si p-n JUNCTION DIODES BY USE OF ELECTRON BEAMS

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Authors

JLJ. J. LanderGeneral Motors (United States)HSHorst SchreiberCorning (United States)TBT.M. BuckMurray State University

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Lander et al. (1963) studied this question.

synapsesocial.com/papers/6a7bfd4b01db1a7270ed3c55https://doi.org/10.1063/1.1753850
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