We have analyzed theoretically and simulated a set of 4-bit RSFQ-logic-based Pseudo Random Generators (PRG). These circuits have been fabricated using low-T/sub c/ niobium technology. We have also investigated experimentally an XOR cell and a shift register with parallel outputs that have been used as compound parts of the PRGs. Experimentally measured margins for DC power supply voltage for a PRG with a serial output, an XOR cell and shift register were 10%, 15%, and 15% respectively. In this paper we discuss various possible applications of a PRG in testing RSFQ circuits and also as a source of "quasiwhite" digital noise.>
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Kidiyarova-Shevchenko et al. (1995) studied this question.
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