An experimental study on the utilization of an electro-conductive surface layer on a dielectric Si3N4 component formed by carbon ion (C+) implantation as a crack gage and a strain gage was conducted. Surface cracks were generated by the Vickers indentation. The electrical resistance of the electro-conductive layer increased with the generation of the surface cracks. The resistance was also influenced by stresses which appeared in the layer. Variation of electrical resistance caused by cracking and stresses was so small that the resisitance must have been measured with high accuracy.
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Nakamura et al. (1993) studied this question.