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SUMMARY Electron energy loss spectroscopy (EELS) has been used in conjunction with high resolution microscopy (HREM) to identify second phase regions in polycrystalline SiC ceramic compacts. Most inclusions were graphitic and contained no boron, though some borides were also identified. Boron could not be detected at grain boundaries, so its role in sintering remains unclear.
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Bourdillon et al. (1981) studied this question.
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