The optimisation of base doping for industrial crystalline silicon solar cells is examined with model calculations. Focus is on the relation between base doping and carrier recombination through the important impurities interstitial iron (Fe i ) and the metastable boron–oxygen (BO) complex. In p ‐type silicon, the optimum base resistivity is strongly dependent on defect concentration. In n ‐type silicon, recombination due to Fe i is much lower and nearly independent of resistivity. Fe i is likely representative for other transition metal impurities. In many real cells a balance between Fe i or similar defects, and BO will occur.
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Geerligs et al. (2004) studied this question.
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