An A-site ordered perovskite manganite SmBaMn 2 O 6 - δ film was fabricated by means of an excimer laser-assisted metal−organic deposition (ELAMOD) and epitaxially grown on a SrTiO 3 (001) substrate. The SmBaMn 2 O 6 - δ film was crystallized in [010]- and [001]-oriented domains that were confirmed by X-ray diffraction and cross-section transmittance electron microscopy (TEM). The A-site ordered structure formed at 500 °C under KrF laser irradiation at a laser fluence of 140 mJ/cm 2 for 60 min in an Ar flow, whereas disordered A-site cations formed under laser irradiation at fluences less than 120 mJ/cm 2 and/or in an oxygen atmosphere. A SmBaMn 2 O 6 film was obtained by oxygen annealing of the as-prepared SmBaMn 2 O 6 - δ film at 500 °C for 3 h. The effects of structural strain due to the substrate on the physical properties of the SmBaMn 2 O 6 film are discussed in terms of the results of structural analysis and electrical resistivity data. The electrical resistivity for the SmBaMn 2 O 6 film on SrTiO 3 (001) show insulating behavior without a first-order charge/orbital order (CO) transition caused by constraint of lattice change associated with the CO because of the undeformable substrate lattice. The ELAMOD process is expected to serve as a new key technique for the fabrication of A-site ordered perovskite manganite thin films.
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Nakajima et al. (2007) studied this question.
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