A microcomputer program has been developed which calculates compositions of unknown compounds by using the intensity ratios of isotope patterns in low‐resolution electron impact mass spectra. The patterns originating from the molecular ion, recognizable daughter ions, and ions from common neutral fragment losses are simultaneously used for the composition analysis, thus improving the reliability compared to previously published methods. The method is most suitable for analysing spectra of compounds giving intense, well‐shaped and separate peak patterns of daughter ions. The program is also able to analyse the compositions of the analytically useful compounds of boron.
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Aarni Tenhosaari (1988) studied this question.
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