All-optical measurement of vertical charge carrier transport in mid-wave infrared InAs/GaSb type-II superlattices

Time-resolved differential transmission measurements were used to investigate vertical charge carrier transport in mid-wave infrared InAs/GaSb type-II superlattices (T2SLs). By optically generating excess carriers near one end of the mid-wave T2SL and measuring the transit time to a thin, lower-bandgap T2SL at the other end, the time-of-flight of vertically diffusing carriers was measured. Through investigation of both unintentionally doped and p-type T2SLs, the vertical hole and electron diffusion coefficients were measured to be 0.04 ± 0.03 cm2/s and 4.7 ± 0.5 cm2/s, corresponding to vertical mobilities of 6 ± 5 cm2/Vs and 700 ± 80 cm2/Vs, respectively, at a temperature of 77 K.