Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Tony Warwick; Harald Ade; S. Cerasari; Jonathan D. Denlinger; Keith D. Franck; Adrian Garcia; Shinjiro Hayakawa; Adam P. Hitchcock; Jun Kikuma; Stefan Klingler; Jeffrey B. Kortright; G. Morisson; Mario M. Moronne; E. G. Rightor; Eli Rotenberg; Sudipta Seal; Hyun‐Joon Shin; W. F. Steele; B. P. Tonner

doi:10.1107/s0909049597014283

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Abstract

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

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Warwick et al. (1998) studied this question.

synapsesocial.com/papers/6a7e4e8291d72aebec32f6d2 https://doi.org/10.1107/s0909049597014283

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Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

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Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

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