Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source

We have been developing an instrument that combines the techniques of x-ray photoelectron spectroscopy and zone plate microfocusing to perform spectromicroscopy. The X1A undulator provides a bright photon source in the soft x-ray range with a high degree of spatial coherence (a requirement for zone plate focusing). A spherical grating monochromator selects the desired photon energy in the 280–800 eV range. A Fresnel zone plate focuses the beam to a small spot. Photoelectron spectra can be acquired from the small irradiated area with an electron energy analyzer. With the beam focused on the surface and the sample mechanically scanned, element-specific or chemical-state-specific images of the surface can be obtained.