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Origin of the X-Unit and the Scale of X-Ray Wavelengths. - The wavelengths of X-ray emission lines measured relative to each other by the high precision methods of crystal diffraction are mostly known with a precision of 1 part in 10^(4) to 10^(5). By refined and very careful measurements with the 2-crystal spectrometer, an imprecision approaching and in some cases perhaps even smaller than a part in a million can be obtained.
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Jesse W. M. DuMond (1959) studied this question.
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