Charge tunneling injection through a thin teflon film between the electrodes and organic semiconductor layer: Relation to morphology of the teflon film

The different behaviors of enhancement of charge injection of an organic electronic device were observed by the incorporation, into the device, of the flat and rough insulating layers (polytetrafluoroethylene) separating the indium tin oxide and organic semiconductor [tris(8-hydroxyquinoline) aluminum]. The observed charge injection enhancements can be explained by the carrier tunneling injection only when the morphology of the insulating layers was taken into account in the calculation based on the tunneling model. Our research in theory and experiment provided a further understanding of the carrier tunneling injection through the thin insulating film in organic electronic devices.