Orientation of X lines in asymmetric magnetic reconnection—Mass ratio dependency

Using fully kinetic simulations, we study the X line orientation of magnetic reconnection in an asymmetric configuration. A spatially localized perturbation is employed to induce a single X line, which has sufficient freedom to choose its orientation in three‐dimensional systems. The effect of ion to electron mass ratio is investigated, and the X line appears to bisect the magnetic shear angle across the current sheet in the large mass ratio limit. The orientation can generally be deduced by scanning through the corresponding 2‐D simulations to find the reconnection plane that maximizes the peak reconnection electric field. The deviation from the bisection angle in the lower mass ratio limit is consistent with the orientation shift of the most unstable linear tearing mode in an electron‐scale current sheet.