Writing high and low! Atomic force microscopy (AFM) is used to fabricate nanolines and nanopits (see Figure) on a poly(methacrylic acid) (PMAA) film deposited on a Si(100) substrate. The kinetics and growth of the nanopattern from the polymer film are investigated by electrostatic nanolithography by using different applied voltages, duration of patterning, and speed of the AFM tip.
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Subbiah et al. (2006) studied this question.
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