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The magnetic characteristics of magnetic force microscopy (MFM) tips were studied by using several methods with a Lorentz transmission electron microscope a magnetoresistive head, and a thin-film inductive head. The results obtained indicate that high-resolution observation with little disturbance of the sample’s magnetic state can be achieved by using a CoPtCr-coated MFM tip.
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Sueoka et al. (1994) studied this question.
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