Impedance spectroscopy is a powerful method for characterizing the electrical properties of materials and their interfaces. In this study we use capacitance measurements to investigate the degradation of electrically aged bottom-emitting organic light-emitting diodes with different polymeric hole injection layers. The devices comprise a heterojunction between a hole transporting triphenyl-diamine and an electron transporting and green emitting aluminum chelate complex [Alq3, tris-(8-hydroxyquinoline) aluminum]. A detailed analysis of the capacitance as function of frequency and dc bias yields information about trapped and interfacial charges as well as the dynamics of injected charges. We find that the loss of luminance and the increase in drive voltage of stressed devices is accompanied by a deterioration of hole injection and the formation of positively charged quenching centers at or close to the organic heterojunction. Using a new polymeric hole injection layer leads to improved device stability.
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Nowy et al. (2010) studied this question.
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