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A new approach to computer simulation of capacitance effects in MOS transistors is presented. It is shown that charge nonconservation is the result of faulty mathematical modeling of the capacitive nonlinearities in the SPICE circuit simulator and is not intrinsic to any specific charge or capacitance model. The correct mathematical model is described. The results of computer simulations using the Meyer capacitance model, which conserves charge, are given for some test circuits.>
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M.A. Cirit (1989) studied this question.
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