In this paper a method for disentangling the various noise components in semiconductor radiation detector–amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/f series noise, and f parallel noise can be quickly obtained through a multiparameter least-squares interpolation of the equivalent noise charge data of the system.
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Bertuccio et al. (1993) studied this question.
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