Using transmission and reflection measurements under normal incidence in one and three layers of a mum-scale metamaterial consisting of pairs of short-slabs and continuous wires, fabricated by a photolithography procedure, we demonstrate the occurrence of a negative refractive index regime in the far infrared range, ~2.4-3 THz. The negative index behavior in that system at ~2.4-3 THz is further confirmed by associated simulations, which are in qualitative agreement with the experimental results.
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Gundogdu et al. (2008) studied this question.
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