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April 1, 1997Langmuir

Scanning Probe Lithography. 4. Characterization of Scanning Tunneling Microscope-Induced Patterns in n-Alkanethiol Self-Assembled Monolayers

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JSJonathan SchoerDuPont (United States)RCRichard M. CrooksUniversity of California, Riverside

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Cite This Study

Schoer et al. (1997) studied this question.

synapsesocial.com/papers/6a82895d8757ed1e601330c5https://doi.org/10.1021/la960369v
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