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May 1, 1993Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Luminescence from Si1−xGex/Si quantum wells grown by Si molecular-beam epitaxy

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Authors

SFS. FukatsuTokyo University of the ArtsNUNoritaka UsamiInstitute for SustainabilityYSY. ShirakiMitsubishi Electric (Japan)

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Cite This Study

Fukatsu et al. (1993) studied this question.

synapsesocial.com/papers/6a829d5baab30c8fb7b281e2https://doi.org/10.1116/1.586732
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