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This paper investigates the robustness of different ground plane configurations of superconducting circuits against magnetic flux trapping. The robustness of the circuit is determined by the change of the error rate at a specific operating point under the influence of an external magnetic field. A large number of thermocycles are used to determine the statistic properties of the error rate. The proposed measurement setup allows a fast scan of a two-dimensional operating area.
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Ebert et al. (2009) studied this question.
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