We have studied niobium point contacts which are very consistent and reproducible from junction to junction, in both their dc and high-frequency behavior. We find a strong correlation between the sharpness of the gap structure and the ac Josephson effect, and we present the first quantitative measurements of the far-infrared frequency dependence of the Josephson effect above the energy gap. The measured I-V curves are also compared with available theoretical models.
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Weitz et al. (1978) studied this question.
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