Methods for characterization of epoxy‐functionalized substrates used for microarray applications, prepared by silanization with 3‐glycidoxypropyltrimethoxysilane, have been developed. Contact angle measurements, X‐ray photoelectron spectroscopy, time of flight secondary ion mass spectrometry and fluorescence based methods have been applied to investigate these epoxy‐functionalized microarray substrates. The surface density of epoxy‐functionalized glass slides was investigated by fluorescence labeling of surface species utilizing Rhodamine 110 as fluorescence probe.
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Funk et al. (2011) studied this question.
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