System for Low Temperature X-Ray Diffraction Studies

Jim Intrater; Andreas Appel

doi:10.1063/1.1717622

September 1, 1961Review of Scientific Instruments

System for Low Temperature X-Ray Diffraction Studies

View at Publisher

Ask AI

Bookmark

Share

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation J. Intrater, A. Appel; System for Low Temperature X‐Ray Diffraction Studies. Rev. Sci. Instrum. 1 September 1961; 32 (9): 1065–1066. https://doi.org/10.1063/1.1717622 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioReview of Scientific Instruments Search Advanced Search |Citation Search

Discussion

No takes yet. Share an insight, caveat, or question.

Cite This Study

Intrater et al. (1961) studied this question.

synapsesocial.com/papers/6a82c56b0e1c3f48100f7562 https://doi.org/10.1063/1.1717622

View at Publisher

Ask AI

Bookmark

Share

System for Low Temperature X-Ray Diffraction Studies

Abstract

Discussion

Cite This Study

System for Low Temperature X-Ray Diffraction Studies

Abstract

Discussion

Cite This Study

Keep reading

Keep reading