Electrical properties of nonvolatile memory devices containing core/shell CdSe∕ZnS nanoparticle double arrays embedded in the C60 layers formed by using a spin-coating technique were investigated. Transmission electron microscopy images showed that CdSe∕ZnS nanoparticles were randomly distributed in the C60 layers. Capacitance-voltage (C-V) measurements on Al∕C60/double-stacked CdSe∕ZnS nanoparticle arrays/C60∕p-Si devices showed that the flat-band voltage shift of the C-V curve related to the charge storage density was enhanced due to a stack of the CdSe∕ZnS nanoparticle layers and that the flat-band voltage shift increased with the magnitude of applied bias voltage due to the variations of the charged electron density in the stacked CdSe∕ZnS nanoparticle double arrays.
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Li et al. (2008) studied this question.
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