XPS data have been obtained from a polycrystalline Ag foil supplied by AESAR. Initial data indicates a highly contaminated surface region. The foil was heated to 250° C and then sputtered with a 2 keV beam of Ar+ for 35 min. Ion scattering spectroscopy, angle-resolved Auger electron spectroscopy, and x-ray photoelectron spectroscopy data indicate the presence of a small amount of subsurface oxygen which could not be removed by the cleaning procedure used. These spectra will be useful in XPS studies of Ag systems such as alumina-supported silver epoxidation catalysts.
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Hoflund et al. (1994) studied this question.
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