This paper is considered a first approach to detecting the domain configuration of coated Si–Fe sheets by computer-controlled field scanning. A topogram of the domains is plotted, and the physical origin of the detected field components is discussed. Also, stray field topograms of magnetized sheets are presented. These indicate that the field intensity cannot be associated with the angle of misorientation of an individual grain.
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Pfützner et al. (1983) studied this question.
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