The full characterization of a time resolved x-ray spectrometer is presented. It is based on the coupling of a conical crystal with a subpicosecond x-ray streak camera. The detector is designed to operate in accumulation mode at high repetition rate (up to 1 kHz) allowing signal to noise ratio as high as 10(4):1. Optical switches have been used to limit the jitter induced in the subpicosecond range, demonstrating the very long term stability (a few hours) of the entire device. The data analysis have been developed to get the spectral and temporal resolution of an ultrashort laser-plasma-based x-ray source.
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Bonté et al. (2007) studied this question.
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