The thermal stability of exchange-biased magnetic tunnel junctions is explored using near-edge x-ray absorption fine-structure spectroscopy. Structures with Ir–Mn antiferromagnetic exchange bias layers are much more thermally stable than similar structures with Fe–Mn exchange bias layers. In both cases, diffusion of Mn from the antiferromagnetic layer through thin exchange-biased ferromagnetic layers to the tunnel barrier is observed at elevated temperatures. This observation explains the diminished magnetoresistance of these structures on annealing even though the resistance of the tunnel junctions is hardly changed.
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Samant et al. (2000) studied this question.
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