Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields

We present a system built to perform measurements of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture collector lens. These distributions contain information about the three-dimensional electromagnetic field that results from the interaction of a tightly focused field and a sub-resolution scatterer. Experimental evidence proving that the system allows for high polarization-dependent sensitivity to sub-resolution displacements of a sub-resolution scatterer is provided together with the corresponding numerical results.