We have studied the compositional dependence of the layered structure of Bi₁₊ₓTe_1-x thin films and its relation with the transport properties. We have observed that the Bi₁₊ₓTe_1-x films have a stable structure near the Bi₁Te₁ composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi₁Te₁. We have determined possible layered structures, configured with two sequences of Bi--Bi and Te--Bi--Te--Bi--Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 {} and 136 {}. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.
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Kim et al. (2001) studied this question.
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