Defocus imaging by transmission electron microscopy is applied for the first time to semi-crystalline polymers. The imaging of the amorphous and crystalline regions by this technique is due to the different inner potentials of the two regions. Evidence is presented that the technique permits the direct observation of the amorphous and crystalline regions in semi-crystalline polymers without any special preparation procedure such as staining. In comparison with other known methods, the main advantages of the new technique are better resolution and wider applicability.
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Petermann et al. (1975) studied this question.
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