Microwave Device Characterization Using a Widefield Diamond Microscope

Microwave devices are at the heart of many classical and emerging quantum technologies, but development can be hindered by the techniques available for characterization and debugging. The authors present a microscope that uses fluorescent, atomlike defects in diamond (N-V centers, which themselves have arisen as a major research topic) to image the microwave fields a few micrometers above microwave circuitry. This enables i00exn s00exi00ext00exu, noninvasive, real-time exploration of device function and failure. Studies of test structures reveal surprising features, which will inspire further engagement with the microwave-engineering community.