A novel broadband multiport reflectometer, consisting of a standard 4 × 4 Butler matrix and an additional directional coupler is proposed. It is shown that such a reflectometer provides highly uniform tunable measurement conditions allowing for measurement precision enhancement. The impact of the applied directional coupler's imperfections on the measurement conditions has been theoretically analyzed. The high measurement accuracy of the proposed reflectometer has been proved experimentally by reflection coefficient measurements over the frequency range of 1–5 GHz, which show a good agreement with the results obtained using VNA.
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Staszek et al. (2014) studied this question.
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