The problem of the in-plane scattering of a TE guided wave by both waveguidesurface roughness and refractive-index fluctuations has been analyzed. Simple formulas emerge for the relative strength of the two scattering mechanisms and for the power collected by an off-axis detector. The theory is illustrated by applying it to the case of a step-index slab waveguide.
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Dennis G. Hall (1985) studied this question.
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