A multiprocessor data acquisition and analysis system for scanning tunneling microscopy

A new data acquisition and analysis system for scanning tunneling microscopy has been developed. With a single system, topography studies and current imaging tunneling spectroscopy can be performed, nanometer-scale indentations can be made, and the off-line analysis can be done. The system is based on the parallel use of several processors allowing for simultaneous data acquisition, processing, and display. User interfacing is done only via a host computer, a UNIX system with three-dimensional display capabilities, while the measurements and indentations are done via a second processor with optimal real-time characteristics.